Siemens SMART platform system
Our Siemens SMART 3-circle platform diffractometer was purchased with an NSF grant in 1994 (CHE-9422567) and upgraded with a KRYOFLEX low temperature device and an APEX II CCD area detector via an NSF grant in 2004 (CHE-0342508).
The X-ray source is a fine-focus sealed tube that delivers Mo Kα radiation (50 kV, 30 mA) through a graphite monochromator and a MonoCap focusing collimator.
Data collections, which generally take from 12 to 24 hours, are performed at 100 K, but temperatures of 90 to 300 K are available.
Data collection, reduction, and correction are managed by the APEX3 suite of programs from Bruker.
Structure solution, structure refinement, and report generation are performed with SHELX software written by Prof. Dr. George Sheldrick.
Absolute configuration can be determined for single crystals that contain at least one element with a minimum of about 14 electrons (i.e., Si). Relative configuration can always be assigned, so long as one stereocenter is known.